Secondary Instrument Master:
|Specifications, sensitivities, etc.||Start-up, calibrations, observing procedures.||Data backup, data reduction, comments.|
|Where's that page?||For Keck staff|
NIRSPEC is a cross-dispersed echelle spectrograph designed for Keck II. It can be used with or without AO.
|Principal Investigator: Ian McLean (UCLA)||NIRSPEC
Reference (via ADS)
McLean et al. 1998, SPIE, 3354, 566.
NIRSPEC was designed and built by the UCLA Infrared Laboratory under the leadership of PI Ian McLean. The instrument is optimized as a high-resolution spectrograph for the wavelength region from 0.95-5.5 μm. The resolving power (R=λ/Δλ) is 25,000 (12 km/s) for a slit width of Θ=0.43 arcseconds (3 pixels). Alternatively, the RΘ product is 10,800. A special low-resolution mode of R=2,500 is also provided. NIRSPEC has 3 detectors: a standard CCD camera for acquisition and offset guiding, a 1-2.5 μm near-infrared "slit-viewing" camera - the SCAM, and the primary 1024 x 1024 IR array for the spectrograph itself.