Instrument Master:
Secondary Instrument Master:
| Pre-Observing | Observing | Post-Observing |
|---|---|---|
| Specifications, sensitivities, etc. | Start-up, calibrations, observing procedures. | Data backup, data reduction, comments. |
| Troubleshooting | Index | Technical Pages |
| Where's that page? | For Keck staff |
NIRSPEC is a cross-dispersed echelle spectrograph designed for Keck II. It can be used with or without AO.
| Principal Investigator: Ian McLean (UCLA) | NIRSPEC
Reference (via ADS)
McLean et al. 1998, SPIE, 3354, 566. |
NIRSPEC was designed and built by the UCLA Infrared Laboratory under the leadership of PI Ian McLean. The instrument is optimized as a high-resolution spectrograph for the wavelength region from 0.95-5.5 μm. The resolving power (R=λ/Δλ) is 25,000 (12 km/s) for a slit width of Θ=0.43 arcseconds (3 pixels). Alternatively, the RΘ product is 10,800. A special low-resolution mode of R=2,500 is also provided. NIRSPEC has 3 detectors: a standard CCD camera for acquisition and offset guiding, a 1-2.5 μm near-infrared "slit-viewing" camera - the SCAM, and the primary 1024 x 1024 IR array for the spectrograph itself.