NIRSPEC - The Near Infrared Echelle Spectrograph

Principal Investigator: Ian S. McLean (UCLA), Michael P. Fitzgerald (UCLA)

References:
The Design and Development of NIRSPEC: A Near-Infrared Echelle Spectrograph for the Keck II Telescope, Ian S. McLean et al., 1998, SPIE vol. 3354, pp. 566-578.

Optical design of the slit-viewing camera for the NIRSPEC upgrade, Emily C. Martin et al., 2016,SPIE vol. 9908

An overview of the NIRSPEC upgrade for the Keck II telescope, Emily C. Martin et al., 2018, SPIE vol. 10702

Characterization and performance of the upgraded NIRSPEC on the W. M. Keck Telescope, Ronald A. López et al., 2020, SPIE vol. 11447

Overview:

The Near Infrared Spectrometer (NIRSPEC), a cryogenic cross-dispersed echelle spectrograph, features spectroscopy over the 0.96-5.5 micron range at low and high resolving powers, R ~2000 and R ~25,000. The slit-viewing camera provides additional capability to image the slit field in a 40 x 40 arcsecond FOV from 0.95 - 5.5 microns. The software interface includes planning tools for users to prepare observational setups and exposure sequences. NIRSPEC was upgraded in 2018 with new detectors and a modern control system.


Detector Characteristics

Updated: December 2020
Slit-viewing Camera (SCAM)
Detector Teledyne H2RG 256x256 (sub-arrayed)
Plate Scale 0.157 ± 0.001 "/pixel
Gain 10.9 e-/ADU (measured)
Read Noise 130 e- (preliminary)
Linear Limit 10,000 ADU
Minimum Integration 0.67 sec in CDS mode
Charge Persistence negligable
Field of View 40" square field
Wavelength Sensitivity 0.95 - 5.5 microns
SCAM detector layout low resolution diagram
high resolution diagram

Spectrograph (SPEC)
Detector Teledyne H2RG 2048x2048, 18 micron pixels
Gain 3.01 ± 0.08 e-/ADU
Read Noise 11.56 e- (3.84 ADU, MCDS 16)
Dark Current 0.70 ± 0.004 e-/s
Linear Limit 25,000 ADU
Minimum integration 1.5 sec in CDS mode
Charge Persistence negligable
Wavelength Sensitivity 0.95 - 5.5 microns
SPEC detector layout low resolution diagram
high resolution diagram

Filter Information

Details of NIRSPEC's science filters here.


Measured Spectral Dispersion

In high resolution mode, NIRSPEC covers echelle orders that span m = 81 to 14 (0.95 - 5.5 microns). See plot of measured dispersion values (m= 30-80). Download details of measured high resolution dispersion values here.


Basic NIRSPEC Specifications

Location RNAS, Keck-2, f/15 input beam
Spectroscopy: Low resolution: R=2000 (150 km/s), 3-pixel slit (0.38")
High resolution: R=25,000, 4.5-pixel slit (0.43")
Low-Res Slits: 42x0.380" (3-pix)
42x0.570" (4.5-pix)
42x0.760" (6-pix)
High-Res Slits: 0.144"x12 (1.5-pix)
0.288"x12 (3-pix)
0.432"x12 (4.5-pix)
0.576"x12 (6-pix)
0.720"x12 (7.5-pix)
0.288"x24 (3-pix)
0.432"x24 (4.5-pix)
0.720"x24 (7.5-pix)
Annular Guider: 1024x1024 MAGIQ, 0.20 arcsec pixels, annular FOV. Filters: V, R, I, RG780, ND: Open, ND1, ND2, ND3, ND4
Guiding with SCAM not avaiable.
Optics: Spectrograph optics all reflecting, diamond-machined, post-polished, Al/Ni-Al substrates, silver or gold coated.
Cryogenics: Full vacuum enclosure, CCR continuous cooling to ~55 K (30 K for the H2RGs).
All cryogenic mechanisms, including image derotator to fix sky PA on slit.
Electronics: Linux-based architecture.
User Interface: Python (mechanism control,quicklook & target acquisition) and IDL (echelle format simulator, calibration GUI).
Performance: SCAM image quality FWHM 0.3-0.55" typical.
SCAM J-band zero point: 24.7 mag @ 1 DN/s.
Complete performance details for SPEC here.

Diagram of Slit Wheel Layout


Additional Information

Web & Contact
WWW sites: NIRSPEC Home Page
UCLA NIRSPEC Page
CARA contact: